On December 14, 2023, the 2023 Expert Aurora Award ceremony was held in Shenzhen, where representatives from hundreds of SiC&GaN companies came together to witness the glory of the third-generation semiconductor industry. After careful selection and evaluation by industry experts and judges, CETC Fenghua Company was awarded the "Third Generation Semiconductor Annual Equipment Enterprise Award" at the conference. This award is mainly awarded to enterprises that have a certain reputation in the third-generation semiconductor field, have achieved important results, and have achieved advanced technology in the industry at home and abroad. They have made outstanding achievements or played a leading role in promoting industry development, technological innovation, and market promotion. The Mars series wafer defect detection equipment, produced by Zhongdian Fenghua Company, is a key equipment in the production process of third-generation semiconductor materials, used for defect detection of silicon carbide substrates, epitaxial wafers, and corrosion wafers. The R&D team has many years of experience in the development of semiconductor quantity detection equipment, mastering key optical detection technologies such as bright field, dark field, and photoluminescence. This series of equipment has been launched and used in multiple domestic leading substrate, epitaxial, and chip production enterprises.

In the future, Fenghua Company will continue to pursue technological breakthroughs and be committed to the independent and localized construction of the semiconductor industry chain, safeguarding the independent, controllable and high-quality development of China's third-generation semiconductor industry!